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1

Nanocomposite Creep: Control of Epoxy Creep Using Graphene (Small 11/2012)

Ardavan Zandiatashbar, Catalin R. Picu, Nikhil Koratkar

Journal:

Year:

2012

File:

PDF, 2.34 MB

2012

2

Effect of defects on the intrinsic strength and stiffness of graphene

Zandiatashbar, Ardavan, Lee, Gwan-Hyoung, An, Sung Joo, Lee, Sunwoo, Mathew, Nithin, Terrones, Mauricio, Hayashi, Takuya, Picu, Catalin R., Hone, James, Koratkar, Nikhil

Journal:

Nature Communications

Year:

2014

Language:

english

File:

PDF, 1.39 MB

english, 2014

3

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Metrology, Inspection, and Process Control for Microlithography XXX - Studying post-etching silicon crystal defects on 300mm wafer by automatic defect review AFM

Sanchez, Martha I., Ukraintsev, Vladimir A., Zandiatashbar, Ardavan, Taylor, Patrick A., Kim, Byong, Yoo, Young-kook, Lee, Keibock, Jo, Ahjin, Lee, Ju Suk, Cho, Sang-Joon, Park, Sang-il

Year:

2016

Language:

english

File:

PDF, 979 KB

english, 2016

4

Control of Epoxy Creep Using Graphene

Ardavan Zandiatashbar, Catalin R. Picu, Nikhil Koratkar

Journal:

Year:

2012

Language:

english

File:

PDF, 701 KB

english, 2012

5

Fabrication of Graphene Platelet (GPL)-Epoxy Nanocomposites and Characterization by Nanoindentation

Colak, Ozgen U., Zandiatashbar, Ardavan

Journal:

Advanced Materials Research

Year:

2012

Language:

english

File:

PDF, 320 KB

english, 2012

6

Raman spectroscopic imaging of graphene dispersion in polymer composites

Shojaee, S. Ali, Zandiatashbar, Ardavan, Koratkar, Nikhil, Lucca, Don A.

Journal:

Year:

2013

Language:

english

File:

PDF, 449 KB

english, 2013

7

Graphene Nanoribbon Composites

Rafiee, Mohammad A., Lu, Wei, Thomas, Abhay V., Zandiatashbar, Ardavan, Rafiee, Javad, Tour, James M., Koratkar, Nikhil A.

Journal:

Year:

2010

Language:

english

File:

PDF, 3.40 MB

english, 2010

8

Depth sensing indentation of nanoscale graphene platelets in nanocomposite thin films

Zandiatashbar, Ardavan, Picu, Catalin R., Koratkar, Nikhil

Journal:

MRS Proceedings

Year:

2011

Language:

english

File:

PDF, 245 KB

english, 2011

9

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - High-throughput automatic defect review for 300mm blank wafers with atomic force microscope

Cain, Jason P., Sanchez, Martha I., Zandiatashbar, Ardavan, Kim, Byong, Yoo, Young-kook, Lee, Keibock, Jo, Ahjin, Lee, Ju Suk, Cho, Sang-Joon, Park, Sang-il

Year:

2015

Language:

english

File:

PDF, 3.19 MB

english, 2015

10

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, United States (Tuesday 29 September 2015)] Photomask Technology 2015 - Automatic defect review for EUV photomask reticles by atomic force microscope

Hayashi, Naoya, Kasprowicz, Bryan S., Zandiatashbar, Ardavan, Kim, Byong, Yoo, Young-kook, Lee, Keibock, Jo, Ahjin, Lee, Ju Suk, Cho, Sang-Joon, Park, Sang-il

Year:

2015

Language:

english

File:

PDF, 823 KB

english, 2015

11

Automated Non-Destructive Imaging and Characterization of the Graphene/hBN Moiré Pattern with Non-Contact Mode AFM

Zandiatashbar, Ardavan, Kim, Byong, Yoo, Young-kook, Lee, Keibock

Journal:

Microscopy Today

Year:

2015

Language:

english

File:

PDF, 2.92 MB

english, 2015

12

Synergy Derived by Combining Graphene and Carbon Nanotubes as Nanofillers in Composites

Yavari, Fazel, Chen, Limeng, Zandiatashbar, Ardavan, Yu, Zhongzhen, Koratkar, Nikhil

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2012

Language:

english

File:

PDF, 3.81 MB

english, 2012

13

[IEEE 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2017.5.15-2017.5.18)] 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - In-line metrology for atomic resolution local height variation

Kim, Tae-Gon, Kim, Soon-Wook, Vanderwayer, Tom, Jo, Ah-Jin, Lee, Ju Suk, Ahn, Byoung-Woon, Zandiatashbar, Ardavan, Cho, Sang-Joon, Park, Sang-il, Irmer, Bernd, Schmidt, Sebastian

Year:

2017

Language:

english

File:

PDF, 1.40 MB

english, 2017

14

[IEEE 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Opatija, Croatia (2017.5.22-2017.5.26)] 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - In-line metrology for atomic resolution local height variation

Tae-Gon Kim,, Soon-Wook Kim,, Vanderwayer, Tom, Ah-Jin Jo,, Ju Suk Lee,, Byoung-Woon Ahn,, Zandiatashbar, Ardavan, Sang-Joon Cho,, Sang-il Park,, Irmer, Bernd, Schmidt, Sebastian

Year:

2017

Language:

english

File:

PDF, 1.40 MB

english, 2017

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